Sven Lange, M.Sc.

Sensorik (SEN)

Wissenschaftlicher Mitarbeiter

Nahfeldscanner, Ortung und KI-Anwendungen

Büro­anschrift:
Pohlweg 47-49
33098 Paderborn
Raum:
P6.2.3

Publikationen

Aktuelle Publikationen

A Hybrid Data Generation Approach for the Development of an AI-based EMC Interference Recognition Method

S. Lange, M. Olbrich, D. Hemker, J. Maalouly, J. Kutter, D. Schröder, C. Hedayat, M. Kleinen, A. Grünwaldt, J. Bärenfänger, H. Mathis, H. Kuhn, in: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, Bruges, Belgium, 2024.


Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications

J. Maalouly, D. Hemker, S. Lange, M. Olbrich, C. Hedayat, J. Kutter, H. Mathis, in: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, Brugge, Belgium , 2024.


Enhancing Information Extraction in EMC Measurements through Artificial Intelligence

M. Stiemer, S. Lange, D. Schröder, C. Hedayat, J. Maalouly, D. Hemker, H. Mathis, in: 2024 Smart Systems Integration Conference and Exhibition (SSI), IEEE, Hamburg, 2024.


Using Autoencoders to Classify EMC Problems in Electronic System Development

J. Maalouly, D. Hemker, C. Hedayat, M. Olbrich, S. Lange, H. Mathis, Advances in Radio Science 22 (2024) 53–59.


Characterization of Various Environmental Influences on the Inductive Localization

S. Lange, U. Hilleringmann, C. Hedayat, H. Kuhn, J. Förstner, in: 2023 IEEE Conference on Antenna Measurements and Applications (CAMA), IEEE, Genoa, Italy , 2023.


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