About Christian Zietlow
Physicist, Patent Attorney Trainee at Eisenführ Speiser. Feel free to contact me about my research and publications.
Curriculum Vitae
Since 01/2025: German and European Patent Attorney Trainee
Eisenführ Speiser
01/2019 - 12/2024: Doctoral Researcher for Physics at Paderborn University
Doctoral thesis: "A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra"
Submitted: 15th July 2025 | Doctoral Defense: 6th November 2025
Experimental work:
- (Scanning) transmission electron microscopy ((S)TEM), including EELS, EDS and ADF
- Scanning electron microscopy (SEM)
- Nanosphere lithography (NSL)
Computational and theoretical work:
- Statistical modeling of detector noise
- ADMM-based algorithms and spectral deconvolution
- Ray tracing simulations
04/2016 - 08/2018: Master of Science in Physics at Friedrich Schiller University Jena
Master’s thesis: "Emission-characteristics of ZnO-nanowires influenced by external magnetic fields"
- Angle-resolved polarization measurements of ZnO nanowires
- Microphotoluminescence (µ-PL), including optical setup design and magnetic-field control
- Scanning electron microscopy (SEM)
10/2012 - 03/2016: Bachelor of Science in Physics at University of Rostock
Bachelor’s thesis: "Energy-transfer studies on perylene-nano-crystals"
- Correlation of fluorescence intensity with the morphology and topography of organic semiconductor crystals
- Fluorescence microscopy
- Atomic force microscopy (AFM)
Publications
Selected Publications
A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra
C. Zietlow, A Novel Lagrangian-Based Method for the Deconvolution of Electron Energy-Loss Spectra, Universitätsbibliothek Paderborn, 2025.
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps
C. Zietlow, J. Lindner, Ultramicroscopy (2025).
An applied noise model for low-loss EELS maps
C. Zietlow, J. Lindner, Ultramicroscopy 270 (2025).
An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.
C. Zietlow, J. Lindner, Sci Rep 15 (2025) 3815.
ADMM-TGV image restoration for scientific applications with unbiased parameter choice
C. Zietlow, J. Lindner, Numerical Algorithms 97 (2024) 1481–1512.
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