TRR 142 - To nlinear spectroscopy of semiconductor nanostructures with quantum light (A02)

Overview

In this project, we will experimentally and theoretically study transient optical wave-mixing signals of semiconductor nanostructures under resonant excitation with pulsed quantum light. Quantum state tomography of the detected optical signals will provide essential information about the excitation of excitons with quantum light and will allow us to analyze couplings and many-body interactions with high precision. Storage, evolution, and retrieval of quantum correlations in semiconductor quantum dots and quantum wells embedded in microcavities will be explored.

Key Facts

Research profile area:
Optoelectronics and Photonics
Project type:
Research
Project duration:
04/2014 - 12/2025
Funded by:
DFG
Website:
Homepage

More Information

Principal Investigators

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Prof. Dr. Torsten Meier

Computational Optoelectronics and Photonics

About the person
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Ilya Akimov

Technische Universität Dortmund

About the person (Orcid.org)

Cooperating Institutions

TU Dortmund

Cooperating Institution

Publications

Quantum-optical excitations of semiconductor nanostructures in a microcavity using a two-band model and a single-mode quantum field
H. Rose, A.N. Vasil’ev, O.V. Tikhonova, T. Meier, P. Sharapova, Physical Review A 107 (2023).
Temporal sorting of optical multi-wave-mixing processes in semiconductor quantum dots
T. Meier, S. Grisard, A.V. Trifonov, H. Rose, R. Reichhardt, M. Reichelt, C. Schneider, M. Kamp, S. Höfling, M. Bayer, I.A. Akimov, Arxiv:2302.02480 (2023).
Theoretical analysis of four-wave mixing on semiconductor quantum dot ensembles with quantum light
H. Rose, S. Grisard, A.V. Trifonov, R. Reichhardt, M. Reichelt, M. Bayer, I.A. Akimov, T. Meier, in: Ultrafast Phenomena and Nanophotonics XXVII, SPIE, 2023.
Coherent contributions to population dynamics in a semiconductor microcavity
J. Paul, H. Rose, E. Swagel, T. Meier, J.K. Wahlstrand, A.D. Bristow, Physical Review B 105 (2022).
Clinching of Aluminum Materials – Methods for the Continuous Characterization of Process, Microstructure and Properties
R. Kupfer, D. Köhler, D. Römisch, S. Wituschek, L. Ewenz, J. Kalich, D. Weiß, B. Sadeghian, M. Busch, J. Krüger, M. Neuser, O. Grydin, M. Böhnke, C.R. Bielak, J. Troschitz, Journal of Advanced Joining Processes 5 (2022).
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