Sven Lange, M.Sc.

Sensorik (SEN)

Wissenschaftlicher Mitarbeiter

Nahfeldscanner, Ortung und KI-Anwendungen

Büro­anschrift:
Pohlweg 47-49
33098 Paderborn
Raum:
P6.2.3

Publikationen

Aktuelle Publikationen

Characterization of Various Environmental Influences on the Inductive Localization
S. Lange, U. Hilleringmann, C. Hedayat, H. Kuhn, J. Förstner, in: 2023 IEEE Conference on Antenna Measurements and Applications (CAMA), IEEE, Genoa, Italy , 2023.
AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development
J. Maalouly, D. Hemker, C. Hedayat, C. Rückert, I. Kaufmann, M. Olbrich, S. Lange, H. Mathis, in: 2022 Kleinheubach Conference, IEEE, Miltenberg, Germany, 2022.
Modeling and Characterization of a 3D Environment for the Design of an Inductively Based Locating Method by Coil Couplings
S. Lange, C. Hedayat, H. Kuhn, U. Hilleringmann, in: 2022 Smart Systems Integration (SSI), IEEE, Grenoble, France, 2022.
Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods
T. Sander, S. Lange, U. Hilleringmann, V. Geneiß, C. Hedayat, H. Kuhn, in: 2022 Smart Systems Integration (SSI), IEEE, Grenoble, France, 2022.
Far-field Calculation from magnetic Huygens Box Data using the Boundary Element Method
C. Marschalt, D. Schroder, S. Lange, U. Hilleringmann, C. Hedayat, H. Kuhn, D. Sievers, J. Förstner, in: 2022 Smart Systems Integration (SSI), IEEE, Grenoble, France, 2022.
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